SN EN 60749-1 : 2003

Current

Current The latest, up-to-date edition.

SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 1: GENERAL

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Published date: 12-01-2013

Publisher: Swiss Standards

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INTRODUCTION
1 Scope
2 Normative references
3 Terms, definitions and letter symbols
4 Standard atmospheric conditions
5 Electrical measurements
6 Use of electrically defective devices
Annex ZA (normative) Normative references to international
publications with their corresponding European
publications

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Applies to semiconductor devices (discrete devices and integrated circuits) and establishes provisions common to all the other parts of the series.

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Document Type	Standard
ISBN
Pages
Published
Publisher	Swiss Standards
Status	Current

International Equivalents – Equivalent Standard(s) & Relationship - (Show below) - (Hide below)

Equivalent Standard(s)	Relationship
DIN EN 60749-1:2003-12	Identical
IEC 60749-1:2002	Identical
EN 60749-1:2003	Identical
UNE-EN 60749-1:2004	Identical
BS EN 60749-1:2003	Identical
I.S. EN 60749-1:2003	Identical

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