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  • UL 1557 : 6

    Current The latest, up-to-date edition.

    ELECTRICALLY ISOLATED SEMICONDUCTOR DEVICES

    Available format(s):  Hardcopy

    Language(s):  English

    Published date:  19-03-2018

    Publisher:  Underwriters Laboratories

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    Table of Contents - (Show below) - (Hide below)

    FOREWORD
    GENERAL
    1. Scope
    2. Glossary
    3. Units of Measurement
    CONSTRUCTION
    4. General
    5. Insulating Materials
    6. Live Parts
    7. Wiring Terminals
    8. Spacings
    PERFORMANCE
    9. General
    10. Dielectric Voltage - Withstand Test
    11. Limited Thermal Aging Test
    MANUFACTURING AND PRODUCTION - LINE TEST
    12. Dielectric Voltage - Withstand Test
    RATING
    13. General
    MARKING
    14. General

    Abstract - (Show below) - (Hide below)

    The Sixth Edition of the Standard for Safety for Electrically Isolated Semiconductor Devices, UL 1557, has been issued to reflect the latest ANSI approval date and to incorporate the following proposal: • Adding dc production line dielectric testing

    Scope - (Show below) - (Hide below)

    The Sixth Edition of the Standard for Safety for Electrically Isolated Semiconductor Devices, UL 1557, has been issued to reflect the latest ANSI approval date and to incorporate the following proposal: • Adding dc production line dielectric testing

    General Product Information - (Show below) - (Hide below)

    Document Type Standard
    Publisher Underwriters Laboratories
    Status Current
    Supersedes
    View more information

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