INTRODUCTION
1 Scope and object
2 Normative references
3 Definitions, symbols and abbreviations
3.1 Definitions concerning a.c. semiconductor
(non-motor-load) control devices
3.2 EMC definitions
3.3 Symbols and abbreviations
4 Classification
5 Characteristics of a.c. semiconductor controllers
and contactors
5.1 Summary of characteristics
5.2 Type of equipment
5.3 Rated and limiting values for main circuits
5.4 Utilization category
5.5 Control circuits
5.6 Auxiliary circuits
5.7 Vacant
5.8 Coordination with short-circuit protective
devices (SCPD)
6 Product information
6.1 Nature of information
6.2 Marking
6.3 Instructions for installation, operation and
maintenance
7 Normal service, mounting and transport conditions
7.1 Normal service conditions
7.2 Conditions during transport and storage
7.3 Mounting
7.4 Electrical system disturbances and influences
8 Constructional and performance requirements
8.1 Constructional requirements
8.2 Performance requirements
8.3 EMC requirements
9 Tests
9.1 Kinds of tests
9.2 Compliance with constructional requirements
9.3 Compliance with performance requirements
9.4 Special tests
Annex A (normative) Marking and identification of
terminals
Annex B (informative) Typical service conditions for
controllers and contactors
Annex C Vacant
Annex D (normative) Requirements for radiated emission
testing
Annex E (informative) Method of converting CISPR 11
radiated emission limits to transmitted power
equivalents
Annex F (informative) Operating capability
Annex G (informative) Examples of control-circuit
configurations
Annex H (informative) Items subject to agreement between
manufacturer and user
Annex I (normative) Modified test circuit for
short-circuit testing of semiconductor contactors
and controllers
Annex J (informative) Flowchart for constructing bypassed
semiconductor controllers tests
Annex ZA (normative) Normative references to international
publications with their corresponding European
publications