• 17/30343628 DC : 0

    Superseded A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

    BS ISO 25498 - MICROBEAM ANALYSIS - ANALYTICAL ELECTRON MICROSCOPY - SELECTED-AREA ELECTRON DIFFRACTION ANALYSIS USING A TRANSMISSION ELECTRON MICROSCOPE

    Available format(s):  Hardcopy, PDF

    Superseded date:  31-03-2018

    Language(s):  English

    Published date: 

    Publisher:  British Standards Institution

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    Table of Contents - (Show below) - (Hide below)

    Foreword
    Introduction
    1 Scope
    2 Normative references
    3 Terms, definitions and symbols
    4 Principle
    5 Equipment
    6 Specimens
    7 Reference materials
    8 Experimental procedure
    9 Measurement and solution of the SAED patterns
    10 The 180 degrees ambiguity
    11 Uncertainty estimation
    Annex A (informative) - Interplanar spacing of pure
            Au and Al
    Annex B (informative) - Spot diffraction patterns of
            single crystals with body-centred cubic (BCC,
            face-centred cubic (FCC) and hexagonal close
            packed (HCP) structure
    Bibliography

    General Product Information - (Show below) - (Hide below)

    Comment Closes On
    Committee CII/9
    Document Type Draft
    Publisher British Standards Institution
    Status Superseded
    Superseded By

    Standards Referencing This Book - (Show below) - (Hide below)

    ISO/IEC 17025:2005 General requirements for the competence of testing and calibration laboratories
    ISO 15932:2013 Microbeam analysis — Analytical electron microscopy — Vocabulary
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