PD CEN/TR 10354:2011

Foreword
1 Scope
2 Principle
3 Reagents
4 Apparatus
5 Safety precautions
6 Sampling
7 Procedure
8 Expression of results
9 Precision
10 Test report
Annex A (informative) - Test samples used for the
        precision test
Annex B (informative) - Detailed results obtained
        from the precision test
Annex C (informative) - Calibration curve - Preparation
        of oxide beads with pure metals and/or oxides
Bibliography

Provides a X-ray fluorescence (XRF) spectrometric method for the determination of Si and Al contents in ferro-silicon materials.

This Technical Report describes a X-ray fluorescence (XRF) spectrometric method for the determination of Si and Al contents in ferro-silicon materials.

The method is applicable to:

• Si contents between 40 % and 90 %;

• Al contents between 0,5 % and 6 %.

The correction of the spectrometric measurement from spectral interferences on the analytical lines used is essential. This Technical Report is valid for the analytical lines:

• Si Kα 7.126 (for element contents between 45 % and 90 %);

• Al Kα 8.339 (for element contents between 0,8 % and 6 %);

• Fe Kα 1.937 (for element contents between 10 % and 58 %).

NOTE For matrix matching purposes, iron is included in the analytical program to be prepared.

Within the conditions here above, spectral interferences don’t need to be calculated.