• MIL-PRF-19500-355 Revision V:2016

    Current The latest, up-to-date edition.

    Transistor, Unitized Dual, NPN, Silicon, Types 2N2919, 2N2920, JAN, JANTX, JANTXV, JANS, JANHC and JANKC

    Available format(s):  PDF

    Language(s): 

    Published date:  16-11-2016

    Publisher:  US Military Specs/Standards/Handbooks

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    Table of Contents - (Show below) - (Hide below)

    1. SCOPE
    2. APPLICABLE DOCUMENTS
    3. REQUIREMENTS
    4. VERIFICATION
    5. PACKAGING
    6. NOTES

    Abstract - (Show below) - (Hide below)

    Specifies the performance requirements for two electrically isolated, matched NPN radiation hardened silicon transistors as one dual unit.

    Scope - (Show below) - (Hide below)

    This specification covers the performance requirements for two electrically isolated, matched NPN radiation hardened silicon transistors as one dual unit. Four levels of product assurance (JAN, JANTX, JANTXV, and JANS) are provided for each encapsulated device type, and two levels of product assurance (JANHC and JANKC) are provided for each unencapsulated device, as specified in MIL-PRF-19500. Provisions for radiation hardness assurance (RHA) to eleven radiation levels (“E”, “K”, “U”, \"M\", \"D\", \"P\", \"L\", \"R”, “F”, “G” and “H”) are provided for JANTXV, JANS, JANHC, JANKC, JANHCD, and JANKCD product assurance levels.

    General Product Information - (Show below) - (Hide below)

    Development Note Supersedes MIL S 19500/355 (D). (02/2000)
    Document Type Standard
    Publisher US Military Specs/Standards/Handbooks
    Status Current
    Supersedes

    Standards Referencing This Book - (Show below) - (Hide below)

    MIL-PRF-19500 Revision P:2010 SEMICONDUCTOR DEVICES, GENERAL SPECIFICATION FOR
    MIL-STD-750 Revision F:2011 TEST METHODS FOR SEMICONDUCTOR DEVICES
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