• MIL-PRF-19500-382 Revision L:2017

    Current The latest, up-to-date edition.

    Transistor, PNP, Silicon, Low-Power, Encapsulated (Through-Hole and Surface Mount), and Unencapsulated, Radiation Hardness Assurance, Device Types 2N2944A, 2N2945A, 2N2946A, Quality Levels: JAN, JANTX, JANTXV, JANS, JANHC,and JANKC

    Available format(s):  PDF

    Language(s): 

    Published date:  14-04-2017

    Publisher:  US Military Specs/Standards/Handbooks

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    Table of Contents - (Show below) - (Hide below)

    1. SCOPE
    2. APPLICABLE DOCUMENTS
    3. REQUIREMENTS
    4. VERIFICATION
    5. PACKAGING
    6. NOTES

    Abstract - (Show below) - (Hide below)

    Specifies the performance requirements for low-power, PNP, silicon 2N2944A, 2N2945A, 2N2946A transistors for use in high-speed, switching and general purpose amplifier applications.

    Scope - (Show below) - (Hide below)

    This specification covers the performance requirements for low-power, PNP, silicon transistors for use in high-speed, switching and general purpose amplifier applications. A \'M\' and UB \'M\' suffix will indicate a matched pair. Four levels of product assurance are provided for each encapsulated device type as specified in MIL-PRF-19500, and two levels of product assurance are provided for each unencapsulated device type. Provisions for radiation hardness assurance (RHA) to eight radiation levels is provided for quality levels JANTX, JANS, JANHC, and JANKC. RHA level designators \"M\", \"D\", \"P\", \"L\", \"R\", \"F\", \"G\", and \"H\" are appended to the device prefix to identify devices, which have passed RHA requirements.

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    Development Note Supersedes MIL S 19500/382 (B) (02/2000)
    Document Type Standard
    Publisher US Military Specs/Standards/Handbooks
    Status Current
    Supersedes

    Standards Referencing This Book - (Show below) - (Hide below)

    MIL-PRF-19500 Revision P:2010 SEMICONDUCTOR DEVICES, GENERAL SPECIFICATION FOR
    MIL-STD-750 Revision F:2011 TEST METHODS FOR SEMICONDUCTOR DEVICES
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