• PD IEC/TR 62240-1:2013

    Superseded A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

    Process management for avionics. Electronic components capability in operation Temperature uprating

    Available format(s):  Hardcopy, PDF

    Superseded date:  11-04-2018

    Language(s):  English

    Published date:  23-04-2013

    Publisher:  British Standards Institution

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    Table of Contents - (Show below) - (Hide below)

    FOREWORD
    INTRODUCTION
    1 Scope
    2 Normative references
    3 Terms, definitions and abbreviations
    4 Selection provisions
    Annex A (informative) - Device parameter re-characterisation
    Annex B (informative) - Stress balancing
    Annex C (informative) - Parameter conformance assessment
    Annex D (informative) - Higher assembly level testing
    Bibliography

    Abstract - (Show below) - (Hide below)

    Gives information when using semiconductor devices in wider temperature ranges than those specified by the device manufacturer.

    Scope - (Show below) - (Hide below)

    This Technical Report provides information when using semiconductor devices in wider temperature ranges than those specified by the device manufacturer. The uprating solutions described herein are considered exceptions, when no reasonable alternatives are available; otherwise devices are utilized within the manufacturers’ specifications.

    The terms “uprating?? and “thermal uprating?? are being used increasingly in avionics industry discussions and meetings, and clear definitions are included in Clause 3. They were coined as shorthand references to a special case of methods commonly used in selecting components for circuit design.

    This technical report describes the methods and processes for implementing this special case.

    All of the elements of these methods and processes employ existing, commonly used best engineering practices. No new or unique engineering knowledge is needed to follow these processes: only a rigorous application of the overall approach.

    Even though the device is used at wider temperatures, the wider temperatures usage will be limited to those that do not compromise applications performance and reliability, particularly for devices with narrow feature size geometries (e.g., 90 nm and less). This technical report does not imply that applications use the device to function beyond the absolute maximum rating limits of the device specified by the original device manufacturer and assumes that:

    • device usage outside the original device manufacturers’ specified temperature ranges is done only when no reasonable alternative approach is available and is performed with appropriate justification;

    • if it is necessary to use devices outside the original device manufacturers’ specified temperature ranges, it is done with documented and controlled processes that assure integrity of the equipment.

    General Product Information - (Show below) - (Hide below)

    Committee GEL/107
    Development Note Supersedes BS PD IEC TR 62240. (05/2013)
    Document Type Standard
    Publisher British Standards Institution
    Status Superseded
    Superseded By
    Supersedes

    Standards Referencing This Book - (Show below) - (Hide below)

    IEC 60134:1961 Rating systems for electronic tubes and valves and analogous semiconductor devices
    IEC TS 62239-1:2015 Process management for avionics - Management plan - Part 1: Preparation and maintenance of an electronic components management plan
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