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  • IEC 60362:1971

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    Superseded A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
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    Guide for the collection of reliability, availability, and maintainability data from field performance of electronic items

    Available format(s):  Hardcopy, PDF, PDF 3 Users, PDF 5 Users, PDF 9 Users

    Superseded date:  23-07-2013

    Language(s):  English - French

    Published date:  01-01-1971

    Publisher:  International Electrotechnical Committee

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    Abstract - (Show below) - (Hide below)

    Provides recommendations for the collection of reliability data relating to the field performance of electronic items. It provides for the acquisition of data sufficiently comprehensive to permit detailed failure and failure-rate analysis of items operating under various conditions: time, environment, storage, stand-by, repair, etc.

    General Product Information - (Show below) - (Hide below)

    Document Type Standard
    Publisher International Electrotechnical Committee
    Status Superseded
    Superseded By

    Standards Referenced By This Book - (Show below) - (Hide below)

    MIL-HDBK-470 Revision A:1997 DESIGNING AND DEVELOPING MAINTAINABLE PRODUCTS AND SYSTEMS - VOLUME 1
    IEC 61070:1991 Compliance test procedures for steady-state availability
    IEC 60571-3:1990 Electronic equipment used on rail vehicles. Part 3: Components, programmable electronic equipment and electronic system reliability
    CEI 56-32 : 2000 COMPLIANCE TEST PROCEDURES FOR STEADY-STATE AVAILABILITY
    IEC 60571-1:1990 Electronic equipment used on rail vehicles. Part 1: General requirements and tests for electronic equipment
    BS 4200-3:1979 Guide on the reliability of electronic equipment and parts used therein Presentation of reliability data on electronic components (or parts)
    BS QC 790101:1992 Harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Sectional specification for semiconductor integrated circuits excluding hybrid circuits. Internal visual examination for semiconductor integrated circuits excluding hybrid circuits
    BS CECC 23200-003:1991 Specification for harmonized system of quality assessment for electronic components: capability detail specification: single and double sided printed boards with plated-through holes
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