• I.S. EN IEC 61967-4:2021

    Current The latest, up-to-date edition.

    Integrated circuits - Measurement of electromagnetic emissions - Part 4: Measurement of conducted emissions - 1 Ω/150 Ω direct coupling method (IEC 61967-4:2021)

    Available format(s):  Hardcopy, PDF

    Language(s):  English

    Published date:  17-05-2021

    Publisher:  National Standards Authority of Ireland

    For Harmonized Standards, check the EU site to confirm that the Standard is cited in the Official Journal.
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    Table of Contents - (Show below) - (Hide below)

    FOREWORD
    1 Scope
    2 Normative references
    3 Terms and definitions
    4 General
    5 Test conditions
    6 Test equipment
    7 Test setup
    8 Test procedure
    9 Test report
    Annex A (informative) Probe verification procedure
    Annex B (informative) Classification of conducted emission levels
    Annex C (informative) Example of reference levels for automotive applications
    Annex D (informative) EMC requirements and how to use EMC IC measurement techniques
    Annex E (informative) Example of a test setup consisting of an EMC main test board and an EME IC test board
    Annex F (informative) 150 Ω direct coupling networks for common mode emission measurements of differential mode data transfer ICs and similar circuits
    Annex G (informative) Measurement of conducted emissions in extended frequency range
    Bibliography

    Abstract - (Show below) - (Hide below)

    This part of IEC 61967 specifies a method to measure the conducted electromagnetic emission (EME) of integrated circuits by direct radio frequency (RF) current measurement with a 1 Ω resistive probe and RF voltage measurement using a 150 Ω coupling network.

    General Product Information - (Show below) - (Hide below)

    Committee TC 47
    Document Type Standard
    Product Note The date of any NSAIprevious adoption may not matchthe date of its original CEN/CENELEC document.
    Publisher National Standards Authority of Ireland
    Status Current
    Supersedes
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