JEDEC JESD 78F.02:2023
Current
Current
The latest, up-to-date edition.
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This standard establishes the procedure for testing, evaluation and classification of devices and microcircuits according to their susceptibility (sensitivity) to damage or degradation by exposure to a defined latch-up stress.
| DocumentType |
Standard
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| PublisherName |
JEDEC Solid State Technology Association
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| Status |
Current
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| Supersedes |
Summarise
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