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SAE J1113/3_201008

Withdrawn

Withdrawn

A Withdrawn Standard is one, which is removed from sale, and its unique number can no longer be used. The Standard can be withdrawn and not replaced, or it can be withdrawn and replaced by a Standard with a different number.

View Superseded by

Conducted Immunity, 250 kHz to 400 MHz, Direct Injection of Radio Frequency (RF) Power

Available format(s)

Hardcopy , PDF

Withdrawn date

03-10-2019

Superseded by

ISO 11452-7:2003

Language(s)

English

Published date

05-08-2010

€93.68
Excluding VAT

Specifies the direct RF power injection test method and procedure for testing electromagnetic immunity of electronic components for passenger cars and commercial vehicles.

DocumentType
Standard
Pages
10
PublisherName
SAE International
Status
Withdrawn
SupersededBy
Supersedes

This part of SAE J1113 specifies the direct RF power injection test method and procedure for testing electromagnetic immunity of electronic components for passenger cars and commercial vehicles. The electromagnetic disturbances considered in this part of SAE J1113 are limited to continuous, narrowband conducted RF energy.This test method is applicable to all DUT leads except the RF reference ground. The test provides differential mode excitation to the DUT.Immunity measurements of complete vehicles are generally only possible by the vehicle manufacturer. The reasons, for example, are high costs of a large absorber-lined chamber, preserving the secrecy of prototypes or the large number of different vehicle models. Therefore, for research, development, and quality control, a laboratory measuring method for components shall be applied by the manufacturer. This method is suitable over the frequency range of 250 kHz to 400 MHz.This direct RF power injection test is particularly effective when used as part of the engineering development of the electronic component (at the prototype PCB level) where the line by line diagnostic capabilities of this test facilitate cost-effective circuit board level improvements in the RF immunity performance of the module or component

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