SN EN 13925-2 : 2003

Foreword<br>Introduction<br>1 Scope<br>2 Normative references<br>3 Terms and definitions<br>4 Specimen preparation<br>&nbsp;&nbsp;4.1 General preparation<br>&nbsp;&nbsp;4.2 Block specimens<br>&nbsp;&nbsp;4.3 Powder specimens<br>&nbsp;&nbsp;4.4 Analysis of small quantities of sample<br>&nbsp;&nbsp;4.5 Reactive samples and non-ambient conditions<br>5 Data collection<br>&nbsp;&nbsp;5.1 General considerations<br>&nbsp;&nbsp;5.2 Angular range and mode of data collection<br>&nbsp;&nbsp;5.3 Parameters relevant to the quality of collected data<br>6 Data processing and analysis<br>&nbsp;&nbsp;6.1 Background<br>&nbsp;&nbsp;6.2 Peal searching<br>&nbsp;&nbsp;6.3 Pattern decomposition into individual line profiles<br>&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;including background subtraction<br>&nbsp;&nbsp;6.4 Phase identification<br>&nbsp;&nbsp;6.5 Indexing<br>&nbsp;&nbsp;6.6 Lattice parameter refinement<br>&nbsp;&nbsp;6.7 Other types of analysis<br>Annex A (informative) Relationship between the XRPD standards<br>Annex B (informative) Example of Report Form<br>Annex C (informative) Scheme of a typical procedure for<br>&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;XRPD measurements<br>Annex D (informative) Some analytical functions used for<br>&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;profile fitting<br>Annex E (informative) Some methods for testing the internal<br>&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;consistency of XRPD data<br>&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;E.1 General<br>&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;E.2 Figures of Merit for FWHMs and intensities<br>&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;E.3 Figures of Merit for line positions and lattice<br>&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;parameters<br>Bibliography

Describes the basic procedures applied in the X-ray Powder Diffraction (XRPD) method.