BS EN 15991:2015
Current
The latest, up-to-date edition.
Testing of ceramic and basic materials. Direct determination of mass fractions of impurities in powders and granules of silicon carbide by inductively coupled plasma optical emission spectrometry (ICP OES) with electrothermal vaporisation (ETV)
Hardcopy , PDF
English
30-11-2015
European foreword
1 Scope
2 Principle
3 Spectrometry
4 Apparatus
5 Reagents and auxiliary material
6 Sampling and sample preparation
7 Calibration
8 Procedure
9 Wavelength and working range
10 Calculation of the results and evaluation
11 Reporting of results
12 Precision
13 Test report
Annex A (informative) - Results of interlaboratory study
Annex B (informative) - Wavelength and working range
Annex C (informative) - Possible interferences and their
elimination
Annex D (informative) - Information regarding the evaluation
of the uncertainty of the mean value
Annex E (informative) - Commercial certified reference
materials
Annex F (informative) - Information regarding the validation
of an analytical method based on liquid standards in
the example of SiC and graphite
Bibliography
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