• EN 15991:2015

    Current The latest, up-to-date edition.

    Testing of ceramic and basic materials - Direct determination of mass fractions of impurities in powders and granules of silicon carbide by inductively coupled plasma optical emission spectrometry (ICP OES) with electrothermal vaporisation (ETV)

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    Language(s): 

    Published date:  25-11-2015

    Publisher:  Comite Europeen de Normalisation

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    Table of Contents - (Show below) - (Hide below)

    European foreword
    1 Scope
    2 Principle
    3 Spectrometry
    4 Apparatus
    5 Reagents and auxiliary material
    6 Sampling and sample preparation
    7 Calibration
    8 Procedure
    9 Wavelength and working range
    10 Calculation of the results and evaluation
    11 Reporting of results
    12 Precision
    13 Test report
    Annex A (informative) - Results of interlaboratory study
    Annex B (informative) - Wavelength and working range
    Annex C (informative) - Possible interferences and their
            elimination
    Annex D (informative) - Information regarding the evaluation
            of the uncertainty of the mean value
    Annex E (informative) - Commercial certified reference
            materials
    Annex F (informative) - Information regarding the validation
            of an analytical method based on liquid standards in
            the example of SiC and graphite
    Bibliography

    Abstract - (Show below) - (Hide below)

    This European Standard defines a method for the determination of the trace element concentrations of Al, Ca, Cr, Cu, Fe, Mg, Ni, Ti, V and Zr in powdered and granular silicon carbide.Dependent on element, wavelength, plasma conditions and weight, this test method is applicable for mass contents of the above trace contaminations from about 0,1 mg/kg to about 1 000 mg/kg, after evaluation also from 0,001 mg/kg to about 5 000 mg/kg.NOTE 1Generally for optical emission spectrometry using inductively coupled plasma (ICP OES) and electrothermal vaporization (ETV) there is a linear working range of up to four orders of magnitude. This range can be expanded for the respective elements by variation of the weight or by choosing lines with different sensitivity.After adequate verification, the standard is also applicable to further metallic elements (excepting Rb and Cs) and some non-metallic contaminations (like P and S) and other allied non-metallic powdered or granular materials like carbides, nitrides, graphite, soot, coke, coal, and some other oxidic materials (see [1], [4], [5], [6], [7], [8], [9] and [10]).NOTE 2There is positive experience with materials like, for example, graphite, B4C, Si3N4, BN and several metal oxides as well as with the determination of P and S in some of these materials.

    General Product Information - (Show below) - (Hide below)

    Committee CEN/TC 187
    Development Note Supersedes PREN 15991. (12/2015)
    Document Type Standard
    Publisher Comite Europeen de Normalisation
    Status Current
    Supersedes

    Standards Referenced By This Book - (Show below) - (Hide below)

    UNI EN ISO 1927-3 : 2013 MONOLITHIC (UNSHAPED) REFRACTORY PRODUCTS - PART 3: CHARACTERIZATION AS RECEIVED
    BS EN ISO 1927-3:2012 Monolithic (unshaped) refractory products Characterization as received
    I.S. EN ISO 1927-3:2012 MONOLITHIC (UNSHAPED) REFRACTORY PRODUCTS - PART 3: CHARACTERIZATION AS RECEIVED (ISO 1927-3:2012)
    DIN EN ISO 1927-3:2013-03 MONOLITHIC (UNSHAPED) REFRACTORY MATERIALS - PART 3: CHARACTERIZATION AS RECEIVED (ISO 1927-3:2012)
    EN ISO 1927-3:2012 Monolithic (unshaped) refractory products - Part 3: Characterization as received (ISO 1927-3:2012)
    17/30327875 DC : DRAFT JAN 2017 BS ISO 16169 - PREPARATION OF SILICON CARBIDE AND SIMILAR MATERIALS FOR ANALYSIS BY ISO 12677 X-RAY FLUORESCENCE (XRF) - FUSED CAST-BEAD METHOD
    ISO 1927-3:2012 Monolithic (unshaped) refractory products — Part 3: Characterization as received

    Standards Referencing This Book - (Show below) - (Hide below)

    ISO 5022:1979 Shaped refractory products Sampling and acceptance testing
    EN ISO 21068-1:2008 Chemical analysis of silicon-carbide-containing raw materials and refractory products - Part 1: General information and sample preparation (ISO 21068-1:2008)
    ISO 5725-4:1994 Accuracy (trueness and precision) of measurement methods and results Part 4: Basic methods for the determination of the trueness of a standard measurement method
    ISO 21068-1:2008 Chemical analysis of silicon-carbide-containing raw materials and refractory products Part 1: General information and sample preparation
    ISO 5725-2:1994 Accuracy (trueness and precision) of measurement methods and results Part 2: Basic method for the determination of repeatability and reproducibility of a standard measurement method
    ISO 8656-1:1988 Refractory products Sampling of raw materials and unshaped products Part 1: Sampling scheme
    ISO/IEC Guide 98-3:2008 Uncertainty of measurement — Part 3: Guide to the expression of uncertainty in measurement (GUM:1995)
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