ÖNORM EN 15991:2025 11 01
Current
Current
The latest, up-to-date edition.
Testing of Ceramic Raw Materials - Direct Determination of the Mass Fractions of Trace Impurities in Powder- and Granular Silicon Carbide by Optical Emission Spectroscopy with Inductively Coupled Plasma and Electrothermal Evaporation (ETV-ICP-OES)
Available format(s)
Hardcopy
Language(s)
German - English
Published date
01-11-2025
€171.23
Excluding VAT
This document specifies a method for determining the mass fractions of the elements Al, Ca, Cr, Cu, Fe, Mg, Ni, Ti, V and Zr in powdered and granular silicon carbide.
| Committee |
CEN/TC 187
|
| DocumentType |
Standard
|
| Pages |
32
|
| PublisherName |
Osterreichisches Normungsinstitut/Austrian Standards
|
| Status |
Current
|
| Supersedes |
| Standards | Relationship |
| EN 15991:2025 | Identical |
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