02/206147 DC : DRAFT AUG 2002
Superseded
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
View Superseded by
IEC 60603-7-4 ED.1.0 - CONNECTORS FOR ELECTRONIC EQUIPMENT - PART 7-4: DETAIL SPECIFICATION FOR 8-WAY, UNSHIELDED, FREE AND FIXED CONNECTORS, FOR DATA TRANSMISSIONS WITH FREQUENCIES UP TO 250 MHZ (CAT 6, UNSHIELDED)
Superseded date
27-04-2005
Superseded by
Published date
23-11-2012
Publisher
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Committee |
EPL/48/2
|
DocumentType |
Draft
|
PublisherName |
British Standards Institution
|
Status |
Superseded
|
SupersededBy |
IEC 61076-1:2006 | Connectors for electronic equipment - Product requirements - Part 1: Generic specification |
IEC 60352-3:1993 | Solderless connections - Part 3: Solderless accessible insulation displacement connections - General requirements, test methods and practical guidance |
IEC 60512-8:1993 | Electromechanical components for electronic equipment; basic testing procedures and measuring methods - Part 8: Connector tests (mechanical) and mechanical tests on contacts and terminations |
IEC 60352-6:1997 | Solderless connections - Part 6: Insulation piercing connections - General requirements, test methods and practical guidance |
IEC 60068-1:2013 | Environmental testing - Part 1: General and guidance |
IEC 60512-13-2:2006 | Connectors for electronic equipment - Tests and measurements - Part 13-2: Mechanical operation tests - Test 13b: Insertion and withdrawal forces |
IEC 60068-2-38:2009 | Environmental testing - Part 2-38: Tests - Test Z/AD: Composite temperature/humidity cyclic test |
ISO 1302:2002 | Geometrical Product Specifications (GPS) Indication of surface texture in technical product documentation |
IEC 60352-5:2012 | Solderless connections - Part 5: Press-in connections - General requirements, test methods and practical guidance |
IEC 61156-1:2007+AMD1:2009 CSV | Multicore and symmetrical pair/quad cables for digital communications - Part 1: Generic specification |
IEC 60512-4:1976 | Electromechanical components for electronic equipment; basic testing procedures and measuring methods. Part 4: Dynamic stress tests |
IEC 60512-9:1992 | Electromechanical components for electronic equipment; basic testing procedures and measuring methods - Part 9: Miscellaneous tests |
IEC 60352-2:2006+AMD1:2013 CSV | Solderless connections - Part 2: Crimped connections - Generalrequirements, test methods and practical guidance |
IEC 60512-5:1992 | Electromechanical components for electronic equipment; basic testing procedures and measuring methods - Part 5: Impact tests (free components), static load tests (fixed components), endurance tests and overload tests |
IEC 60512-1:2001 | Connectors for electronic equipment - Tests and measurements - Part 1: General |
IEC 60068-2-14:2009 | Environmental testing - Part 2-14: Tests - Test N: Change of temperature |
EN 50289-1-14:2004 | Communication cables - Specifications for test methods - Part 1-14: Electrical test methods - Coupling attenuation or screening attenuation of connecting hardware |
IEC 60664-1:2007 | Insulation coordination for equipment within low-voltage systems - Part 1: Principles, requirements and tests |
IEC 60050-581:2008 | International Electrotechnical Vocabulary (IEV) - Part 581: Electromechanical components for electronic equipment |
IEC 60512-3:1976 | Electromechanical components for electronic equipment; basic testing procedures and measuring methods. Part 3: Current-carrying capacity tests |
IEC 60352-7:2002 | Solderless connections - Part 7: Spring clamp connections - General requirements, test methods and practical guidance |
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