Comment Closes On
|
|
Committee
|
WEE/46 |
Document Type
|
Draft |
ISBN
|
|
Pages
|
|
Published
|
|
Publisher
|
British Standards Institution
|
Status
|
Superseded |
Superseded By
|
|
ISO 5725-1:1994
|
Accuracy (trueness and precision) of measurement methods and results — Part 1: General principles and definitions |
EN 13925-1:2003
|
Non-destructive testing - X-ray diffraction from polycrystalline and amorphous material - Part 1: General principles |
ISO Guide 30:2015
|
Reference materials Selected terms and definitions |
EN 13925-2:2003
|
Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Part 2: Procedures |
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