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08/30138809 DC : DRAFT FEB 2008

Superseded

Superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

View Superseded by

BS ISO 23812 - SURFACE CHEMICAL ANALYSIS - SECONDARY-ION MASS SPECTROMETRY - METHOD FOR DEPTH CALIBRATION FOR SILICON USING MULTIPLE DELTA-LAYER REFERENCE MATERIALS

Superseded date

31-05-2009

Superseded by

BS ISO 23812:2009

Published date

23-11-2012

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Committee
CII/60
DocumentType
Draft
PublisherName
British Standards Institution
Status
Superseded
SupersededBy

ISO 18115:2001 Surface chemical analysis Vocabulary
ISO 20341:2003 Surface chemical analysis — Secondary-ion mass spectrometry — Method for estimating depth resolution parameters with multiple delta-layer reference materials

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