09/30184127 DC : 0
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
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BS EN 61709 - ELECTRONIC COMPONENTS - RELIABILITY - REFERENCE CONDITIONS FOR FAILURE RATES AND STRESS MODELS FOR CONVERSION
Hardcopy , PDF
31-08-2011
English
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1 Scope
2 Normative references
3 Definitions
4 Symbols
5 Context and conditions
5.1 Failure modes
5.2 Operating profile considerations
5.3 Storage conditions
5.4 Environmental conditions
6 Generic reference conditions and stress models
6.1 Recommended generic reference conditions
6.2 Generic stress models
7 Specific reference conditions and stress models
7.1 Integrated semiconductor circuits
7.2 Discrete semiconductors
7.3 Optoelectronic components
7.4 Capacitors
7.5 Resistors and resistor networks
7.6 Inductors, transformers and coils
7.7 Microwave devices
7.8 Other passive components
7.9 Electrical connections
7.10 Connectors and sockets
7.11 Relays
7.12 Switches and push-buttons
7.13 Signal and pilot lamps
Annex A (Normative) - Failure modes of components
Annex B (Informative) - Failure rate prediction
B.1 Failure Rate Prediction for Assemblies
B.2 Component considerations
B.3 General consideration about failure rate
Annex C (informative) - Considerations for the design
of a data base on failure rates
C.1 General
C.2 Data collection acquisition - collection process
C.3 Which data to collect and how to collect it
C.4 Calculation and decision making
C.5 Failure rate database attributes
Annex D (informative) - Potential sources of failure rate data
and methods of selection
D.1 General
D.2 Data source selection
D.3 User data
D.4 Manufacturer data
D.5 Handbook reliability data
Annex E (informative) - Overview of component classification
E.1 General
E.2 The IEC 61360 system
E.3 Other systems
Annex F (informative) - Examples
BS EN 61709
| Committee |
DS/1
|
| DocumentType |
Draft
|
| Pages |
86
|
| PublisherName |
British Standards Institution
|
| Status |
Superseded
|
| SupersededBy |
| IEC 62308:2006 | Equipment reliability - Reliability assessment methods |
| IEC 61649:2008 | Weibull analysis |
| IEC 60050-151:2001 | International Electrotechnical Vocabulary (IEV) - Part 151: Electrical and magnetic devices |
| IEC 61360-4:2005 | Standard data element types with associated classification scheme for electric components - Part 4: IEC reference collection of standard data element types and component classes |
| IEC 60605-6:2007 | Equipment reliability testing - Part 6: Tests for the validity and estimation of the constant failure rate and constant failure intensity |
| IEC 61163-2:1998 | Reliability stress screening - Part 2: Electronic components |
| IEC 60300-3-2:2004 | Dependability management - Part 3-2: Application guide - Collection of dependability data from the field |
| IEC 60300-3-9:1995 | Dependability management - Part 3: Application guide - Section 9: Risk analysis of technological systems |
| IEC 60721-3-3:1994+AMD1:1995+AMD2:1996 CSV | Classification of environmental conditions - Part 3-3: Classification of groups of environmental parameters and their severities - Stationary use at weatherprotected locations |
| IEC 60717:2012 | Method for the determination of the space required by capacitors and resistors with unidirectional terminations |
| IEC 60300-3-5:2001 | Dependability management - Part 3-5: Application guide - Reliability test conditions and statistical test principles |
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