13/30286153 DC : 0
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
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BS EN 60603-7-81 - CONNECTORS FOR ELECTRONIC EQUIPMENT - PART 7-81: DETAIL SPECIFICATION FOR 8-WAY, SHIELDED, FREE AND FIXED CONNECTORS, FOR DATA TRANSMISSIONS WITH FREQUENCIES UP TO 2000 MHZ
Hardcopy , PDF
30-04-2016
English
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FOREWORD
INTRODUCTION
1 General
2 Terms and definitions
3 Common features and isometric view
4 Cable terminations and internal connections - Fixed
and free connectors
5 Gauges
6 Characteristics
7 Tests and test schedule
Bibliography
BS EN 60603-7-81.
| Committee |
EPL/48
|
| DocumentType |
Draft
|
| Pages |
15
|
| PublisherName |
British Standards Institution
|
| Status |
Superseded
|
| SupersededBy |
| IEC 60603-7-1:2011 | Connectors for electronic equipment - Part 7-1: Detail specification for 8-way, shielded, free and fixed connectors |
| IEC 62153-4-12:2009 | Metallic communication cable test methods - Part 4-12: Electromagnetic compatibility (EMC) - Coupling attenuation or screening attenuation of connecting hardware - Absorbing clamp method |
| ISO/IEC 11801:2002 | Information technology Generic cabling for customer premises |
| IEC 60512-27-100:2011 | Connectors for electronic equipment - Tests and measurements - Part 27-100: Signal integrity tests up to 500 MHz on 60603-7 series connectors - Tests 27a to 27g |
| IEC 60512-26-100:2008+AMD1:2011 CSV | Connectors for electronic equipment - Tests and measurements - Part 26-100: Measurement setup, test and reference arrangements and measurements for connectors according to IEC 60603-7 - Tests 26a to 26g |
| IEC 60603-7:2008+AMD1:2011 CSV | Connectors for electronic equipment - Part 7: Detail specification for 8-way, unshielded, free and fixed connectors |
| IEC 60512-1-100:2012 | Connectors for electronic equipment - Tests and measurements - Part 1-100: General - Applicable publications |
| IEC 60512-2-1:2002 | Connectors for electronic equipment - Tests and measurements - Part 2-1: Electrical continuity and contact resistance tests - Test 2a: Contact resistance - Millivolt level method |
| IEC 60512-25-9:2008 | Connectors for electronic equipment - Tests and measurements - Part 25-9: Signal integrity tests - Test 25i: Alien crosstalk |
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