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Superseded

Superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

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superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

BS EN 62047-16 ED 1.0 - SEMICONDUCTOR DEVICES - MICRO-ELECTROMECHANICAL DEVICES - PART 16: TEST METHODS FOR DETERMINING RESIDUAL STRESSES OF MEMS FILMS; WAFER CURVATURE AND CANTILEVER BEAM DEFLECTION METHODS

Available format(s)

Hardcopy , PDF

Superseded date

31-07-2015

Language(s)

English

FOREWORD
1 Scope
2 Normative references
3 Terms and definitions
4 Testing methods
Bibliography

BS EN 62047-16 ED 1.0.

Committee
EPL/47
DocumentType
Draft
Pages
13
PublisherName
British Standards Institution
Status
Superseded
SupersededBy

IEC 62047-2:2006 Semiconductor devices - Micro-electromechanical devices - Part 2: Tensile testing method of thin film materials
IEC 62047-21:2014 Semiconductor devices - Micro-electromechanical devices - Part 21: Test method for Poisson's ratio of thin film MEMS materials

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€21.85
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