14/30299002 DC : 0
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
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BS EN 60749-44 - SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 44: NEUTRON BEAM IRRADIATED SINGLE EVENT EFFECT (SEE) TEST METHOD FOR SEMICONDUCTOR DEVICES
Hardcopy , PDF
30-11-2016
English
Important note : Users cannot be edited or removed once added to your Multi user PDF.
1 Scope
2 Normative references
3 Terms and definitions
4 Test apparatus
5 Procedure
6 Evaluation
7 Summary
Annex A (informative) - Additional requirements
for the applicable procurement specification
Annex B (informative)
Annex C (informative) - Failure Rate Calculation
BS EN 60749-44.
| Committee |
EPL/47
|
| DocumentType |
Draft
|
| Pages |
19
|
| PublisherName |
British Standards Institution
|
| Status |
Superseded
|
| SupersededBy |
| IEC 60749-38:2008 | Semiconductor devices - Mechanical and climatic test methods - Part 38: Soft error test method for semiconductor devices with memory |
| IEC 62396-4:2013 | Process management for avionics - Atmospheric radiation effects - Part 4: Design of high voltage aircraft electronics managing potential single event effects |
| IEC TS 62396-5:2008 | Process management for avionics - Atmospheric radiation effects - Part 5: Guidelines for assessing thermal neutron fluxes and effects in avionics systems |
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