14/30299002 DC : 0
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
View Superseded by
BS EN 60749-44 - SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 44: NEUTRON BEAM IRRADIATED SINGLE EVENT EFFECT (SEE) TEST METHOD FOR SEMICONDUCTOR DEVICES
Hardcopy , PDF
English
30-11-2016
1 Scope
2 Normative references
3 Terms and definitions
4 Test apparatus
5 Procedure
6 Evaluation
7 Summary
Annex A (informative) - Additional requirements
for the applicable procurement specification
Annex B (informative)
Annex C (informative) - Failure Rate Calculation
BS EN 60749-44.
| Committee |
EPL/47
|
| DocumentType |
Draft
|
| Pages |
19
|
| PublisherName |
British Standards Institution
|
| Status |
Superseded
|
| SupersededBy |
A newer version of this standard is available.
View Current Edition
Please Login or Create an Account so you can add users to your Multi user PDF Later.
Important note : Users cannot be edited or removed once added to your Multi user PDF.