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Superseded
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BS EN 60749-43 - SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 43: GUIDELINES FOR LSI RELIABILITY QUALIFICATION PLANS
Hardcopy , PDF
English
30-09-2017
FOREWORD
1 Scope
2 Normative references
3 Terms and definitions
4 Product categories and applications
5 Failure
6 Reliability test
7 Stress test (items)
8 Supplementary tests
9 Summary table of assumptions
10 Summary
Bibliography
BS EN 60749-43.
| Committee |
EPL/47
|
| DocumentType |
Draft
|
| Pages |
37
|
| PublisherName |
British Standards Institution
|
| Status |
Superseded
|
| SupersededBy |
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