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15/30319018 DC : 0

NA

NA

Status of Standard is Unknown

BS EN 62951-1 ED 1.0 - SEMICONDUCTOR DEVICES - FLEXIBLE AND STRETCHABLE SEMICONDUCTOR DEVICES - PART 1: BENDING TEST METHOD FOR CONDUCTIVE THIN FILMS ON FLEXIBLE SUBSTRATES

Available format(s)

Hardcopy , PDF

Language(s)

English

1 Scope
2 Normative references
3 Terms, definitions and symbols
4 Test piece
5 Testing method and test apparatus
6 Test report
Annex A (informative) - X-Y-theta bending test method
Annex B (informative) - Data analysis: Calculation of
        bending radius and bending strain
Bibliography

BS EN 62951-1 Ed 1.0.

Committee
EPL/47
DocumentType
Draft
Pages
14
PublisherName
British Standards Institution
Status
NA

IEC 62047-2:2006 Semiconductor devices - Micro-electromechanical devices - Part 2: Tensile testing method of thin film materials
IEC 62047-22:2014 Semiconductor devices - Micro-electromechanical devices - Part 22: Electromechanical tensile test method for conductive thin films on flexible substrates

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