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16/30341341 DC : 0

Superseded

Superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

View Superseded by

BS EN 60749-4 - SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 4: DAMP HEAT, STEADY STATE, HIGHLY ACCELERATED STRESS TEST (HAST)

Available format(s)

Hardcopy , PDF

Superseded date

30-11-2017

Superseded by

BS EN 60749-4:2002

Language(s)

English

€23.37
Excluding VAT

FOREWORD
1 Scope
2 Normative references
3 HAST test - General remarks
4 Test apparatus
5 Test conditions
6 Procedure
7 Failure criteria
8 Safety
9 Summary

BS EN 60749-4.

Committee
EPL/47
DocumentType
Draft
Pages
11
PublisherName
British Standards Institution
Status
Superseded
SupersededBy

IEC 60749-5:2017 Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test

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