BS IEC 62396-2 ED2.0 - PROCESS MANAGEMENT FOR AVIONICS - ATMOSPHERIC RADIATION EFFECTS - PART 2: GUIDELINES FOR SINGLE EVENT EFFECTS TESTING FOR AVIONICS SYSTEMS

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Hardcopy , PDF

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English

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British Standards Institution

1 Scope
2 Normative references
3 Terms and definitions
4 Abbreviations used in the document
5 Obtaining SEE data
6 Availability of existing SEE data for avionics
applications
7 Considerations for SEE testing
8 Converting test results to avionics SEE rates
Annex A (informative) - Sources of SEE data published
before year 2000
Bibliography

BS IEC 62396-2 Ed2.0.

Committee	GEL/107
DocumentType	Draft
Pages	44
PublisherName	British Standards Institution
Status	NA

IEC 60749-38:2008	Semiconductor devices - Mechanical and climatic test methods - Part 38: Soft error test method for semiconductor devices with memory
BIS IS/IEC 61558-2-6 : 1ED 2016	SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 44: NEUTRON BEAM IRRADIATED SINGLE EVENT EFFECT (SEE) TEST METHOD FOR SEMICONDUCTOR DEVICES
IEC 62396-4:2013	Process management for avionics - Atmospheric radiation effects - Part 4: Design of high voltage aircraft electronics managing potential single event effects
IEC 62396-5:2014	Process management for avionics - Atmospheric radiation effects - Part 5: Assessment of thermal neutron fluxes and single event effects in avionics systems
IEC 62396-3:2013	Process management for avionics - Atmospheric radiation effects - Part 3: System design optimization to accommodate the single event effects (SEE) of atmospheric radiation
IEC 62396-1:2016	Process management for avionics - Atmospheric radiation effects - Part 1: Accommodation of atmospheric radiation effects via single event effects within avionics electronic equipment

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BS IEC 62396-2 ED2.0 - PROCESS MANAGEMENT FOR AVIONICS - ATMOSPHERIC RADIATION EFFECTS - PART 2: GUIDELINES FOR SINGLE EVENT EFFECTS TESTING FOR AVIONICS SYSTEMS

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