17/30356569 DC : 0
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
BS EN 60749-26 - SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 26: ELECTROSTATIC DISCHARGE (ESD) SENSITIVITY TESTING - HUMAN BODY MODEL (HBM)
Hardcopy , PDF
30-04-2018
English
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FOREWORD
1 Scope
2 Normative references
3 Terms and definitions
4 Apparatus and required equipment
5 Stress test equipment qualification
and routine verification
6 Classification procedure
7 Failure criteria
8 Component classification
Annex A (informative) - HBM test method
flow chart
Annex B (informative) - HBM test equipment
parasitic properties
Annex C (informative) - Example of testing
a product using Table 2, Table 3, or
Table 2 with a two-pin HBM tester
Annex D (informative) - Examples of coupled
non-supply pin pairs
Annex E (normative) - Cloned non-supply (IO)
pin sampling test method
BS EN 60749-26.
| Committee |
EPL/47
|
| DocumentType |
Draft
|
| Pages |
51
|
| PublisherName |
British Standards Institution
|
| Status |
Superseded
|
| IEC 60749-27:2006+AMD1:2012 CSV | Semiconductor devices - Mechanical and climatic test methods - Part27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM) |
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