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19/30390371 DC:2019
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BS IEC 60747-14-11. Semiconductor devices. Part 14-11. Semiconductor sensors. Test method of surface acoustic wave based integrated sensor for measuring ultra violet, illumination and temperature
Available format(s)
Hardcopy , PDF
Language(s)
English
Published date
05-02-2019
Publisher
This international standard defines terms and specifies the test method and report of a surface acoustic wave (SAW)-based sensor integrated with ultraviolet, illumination, and temperature sensors.
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