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19/30390371 DC:2019

Current

Current

The latest, up-to-date edition.

BS IEC 60747-14-11. Semiconductor devices. Part 14-11. Semiconductor sensors. Test method of surface acoustic wave based integrated sensor for measuring ultra violet, illumination and temperature

Available format(s)

Hardcopy , PDF

Language(s)

English

Published date

05-02-2019

This international standard defines terms and specifies the test method and report of a surface acoustic wave (SAW)-based sensor integrated with ultraviolet, illumination, and temperature sensors.

CommentClosesDate
06-02-2019
Committee
EPL/47
DocumentType
Draft
Pages
0
ProductNote
Warning: this draft is not current beyond its expiry date for comments.
PublisherName
British Standards Institution
Status
Current

Standards Relationship
IEC 60747-14-1:2000 Identical

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