AGMA 2010 : REV A : 1994 : R2000

Foreword<br>1 Scope<br>&nbsp;&nbsp;1.1 Recommendations<br>&nbsp;&nbsp;1.2 Standard use<br>2 Definitions of terms<br>3 Application<br>&nbsp;&nbsp;3.1 Calibration<br>&nbsp;&nbsp;3.2 Hierarchy of calibration<br>&nbsp;&nbsp;3.3 Traceability<br>4 Machine environment and condition<br>&nbsp;&nbsp;4.1 Environment<br>&nbsp;&nbsp;4.2 Measurement system condition<br>5 Recommended calibration masters<br>&nbsp;&nbsp;5.1 Master certification<br>&nbsp;&nbsp;5.2 Involute masters<br>&nbsp;&nbsp;5.3 Non-Involute pin or plane (flank) masters<br>&nbsp;&nbsp;5.4 Mounting reference features<br>&nbsp;&nbsp;5.5 Master selection<br>6 Method for determining measurement system variability<br>&nbsp;&nbsp;6.1 The requirements of a measurement system<br>&nbsp;&nbsp;6.2 Application of bias and bias variation<br>Annexes<br>A Master test trace analysis<br>B Modified base circle, pin, and plane (flank) master <br>&nbsp;&nbsp;calculations and interpretations<br>C Integral base circle involute master<br>D X and MR chart<br>E Statistical significance of measurement systems<br>F Calibration procedure

Provides qualification procedures for involute measuring instruments including the design and calibration of involute, pin, and plane (flank) masters. Also covers condition evaluation of the measuring instrument such as probe location, gain, hysteresis, etc.