AIIM TR34 : 0
Current
The latest, up-to-date edition.
SAMPLING PROCEDURES FOR INSPECTION BY ATTRIBUTES OF IMAGES IN ELECTRONIC IMAGE MANAGEMENT (EIM) AND MICROGRAPHIC SYSTEMS
Hardcopy , PDF
English
01-01-1996
Establishes methods that can be used to select and apply sampling inspection plans in order to determine if a lot or batch of electronic or micrographic images meets specified quality requirements. Provides guidance to users when selecting a sampling procedure that will meet risk requirements. Enables users to develop a sampling plan for individual images in a scientific manner.
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