ANSI/ESDA/JEDEC JS-001:2023
Superseded
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
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JOINT JEDEC/ESDA STANDARD FOR ELECTROSTATIC DISCHARGE SENSITIVITY TEST - HUMAN BODY MODEL (HBM) - COMPONENT LEVEL
Available format(s)
Hardcopy , PDF
Language(s)
English
Published date
30-05-2023
Publisher
Superseded date
04-11-2024
Superseded by
Free
Excluding VAT
This standard establishes the procedure for testing, evaluating, and classifying devices and microcircuits according to their susceptibility (sensitivity) to damage or degradation by exposure to a defined human body model (HBM) electrostatic discharge (ESD).
| DocumentType |
Standard
|
| Pages |
56
|
| PublisherName |
JEDEC Solid State Technology Association
|
| Status |
Superseded
|
| SupersededBy | |
| Supersedes |
| DSCC 21221A:2025 | MICROCIRCUIT, LINEAR, RADIATION HARDNESS ASSURED, SYNCHRONOUS BUCK CONVERTER, MONOLITHIC SILICON |
| DSCC V62/25609:2025 | MICROCIRCUIT, DIGITAL, CMOS, 3-LINE TO 8- LINE DECODER/DEMULTIPLEXER WITH LOGIC LEVEL SHIFTER, MONOLITHIC SILICON |
| DSCC V62/06612B:2019 | MICROCIRCUIT, LINEAR, VOLTAGE PREREGULATOR, HIGH POWER FACTOR, MONOLITHIC SILICON |
| DSCC V62/24617:2024 | MICROCIRCUIT, DIGITAL, RADIATION-TOLERANT HEX OPEN-DRAIN BUFFERS WITH INTEGRATED TRANSLATION, MONOLITHIC SILICON |
| JEDEC JESD625C.01:2024 | Requirements for Handling Electrostatic-Discharge-Sensitive (ESDS) Devices |
| DSCC V62/23628:2024 | MICROCIRCUIT, DIGITAL, RADIATION TOLERANT, QUADRUPLE 2-INPUT POSITIVE-NOR GATES, MONOLITHIC SILICON |
| DSCC V62/10610C:2023 | MICROCIRCUIT, LINEAR, 16 CHANNEL, CONSTANT CURRENT SINK LED DRIVER, MONOLITHIC SILICON |
| DSCC V62/24620:2024 | MICROCIRCUIT, DIGITAL, HEX INVERTER BUFFERS/DRIVERS WITH OPEN-DRAIN OUTPUTS, MONOLITHIC SILICON |
| DSCC V62/22612A:2023 | MICROCIRCUIT, BiCMOS, ULTRA-LOW-NOISE JESD204B DUAL-LOOP CLOCK JITTER CLEANER, MONOLITHIC SILICON |
| DSCC V62/18613B:2024 | MICROCIRCUIT, LINEAR, MICROPOWER COMPARATOR, MONOLITHIC SILICON |
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