ANSI/ESDA/JEDEC JS-002:2022
Superseded
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
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ESDA/JEDEC Joint Standard For Electrostatic Discharge Sensitivity Testing Charged Device Model (CDM) Device Level
Available format(s)
Hardcopy , PDF
Language(s)
English
Published date
26-07-2022
Publisher
Superseded date
07-08-2025
Superseded by
Free
Excluding VAT
This document establishes the procedure for testing, evaluating, and classifying devices and microcircuits according to their susceptibility (sensitivity) to damage or degradation by exposure to a defined field-induced charged device model (CDM) electrostatic discharge (ESD).
| Committee |
JC-14.1
|
| DocumentType |
Standard
|
| ISBN |
1-58537-333-8
|
| Pages |
52
|
| PublisherName |
JEDEC Solid State Technology Association
|
| Status |
Superseded
|
| SupersededBy | |
| Supersedes |
| DSCC V62/25635A:2025 | MICROCIRCUIT, LINEAR BiCMOS (LBCSOI2), RADIATION TOLERANT, 2.7 V TO 80 V, 1.1 MHz, RADIATION TOLERANT, 2.7 V TO 80 V, 1.1 MHz, ULTRA-PRECISE, CURRENT-SENSE AMPLIFIER, MONOLITHIC SILICON |
| DSCC V62/24640:2025 | MICROCIRCUIT, BiCMOS, HIGH-PRECISION QUAD COMPARATORS WITH OPEN-DRAIN OR PUSH-PULL OUTPUT, MONOLITHIC SILICON |
| DSCC V62/25615:2025 | MICROCIRCUIT, DIGITAL, ENHANCED PRODUCT, OCTAL EDGE-TRIGGERED D-TYPE FLIP-FLOPS WITH 3-STATE OUTPUTS, MONOLITHIC SILICON |
| DSCC V62/24626:2025 | MICROCIRCUIT, BiCMOS, RADIATION-TOLERANT 3V TO 5.5 V RS-485 TRANSCEIVER WITH FLEXIBLE I/O SUPPLY AND IEC ESD PROTECTION , MONOLITHIC SILICON |
| JEDEC JESD 88F:2018 | JEDEC Dictionary of Terms for Solid- State Technology – 7th Edition |
| JEDEC JESD 99C:2012 | Terms, Definitions, and Letter Symbols for Microelectronic Devices |
| IEC 61340-5-1:2024 | Electrostatics - Part 5-1: Protection of electronic devices from electrostatic phenomena - General requirements |
| JEDEC JESD625C:2022 | REQUIREMENTS FOR HANDLING ELECTROSTATIC-DISCHARGE-SENSITIVE (ESDS) DEVICES |
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