ANSI/ESDA/JEDEC JS-002:2025
Current
Current
The latest, up-to-date edition.
Charged Device Model (CDM) Device Level
Available format(s)
Hardcopy , PDF
Language(s)
English
Published date
07-07-2025
Publisher
Free
Excluding VAT
This document establishes the procedure for testing, evaluating, and classifying devices and microcircuits according to their susceptibility (sensitivity) to damage or degradation by exposure to a defined field-induced charged device model (CDM) electrostatic discharge (ESD).
| Committee |
JC-14.1
|
| DocumentType |
Standard
|
| ISBN |
1-58537-356-7
|
| Pages |
49
|
| PublisherName |
JEDEC Solid State Technology Association
|
| Status |
Current
|
| Supersedes |
| JEDEC JESD 88F:2018 | JEDEC Dictionary of Terms for Solid- State Technology – 7th Edition |
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