AS 2530-1982

Provides guidance on the presentation of the detailed data, such as the change in a characteristic with time or on the failure rate(s) of the associated component(s), that are essential to the prediction of the operating performance of electronic or similar equipment. The Standard is technically identical with IEC 319.

This standard is intended to provide guidance on the presentation of data necessary to distinguish the reliability characteristics of an electronic component, but may also be applicable to other engineering terms.The data may relate to failures and failure rates or changes (or drift) of characteristics.Such factual information should be available to the circuit and equipment designer to enable him to correctly assess the reliability of his circuits and units.This information will be obtained from reliability tests made on the electronic components in laboratories and should be presented as indicated herein.NOTES:1. The validity and value of reliability test information and data depend upon the testing procedures, methods, duration, sample sizes, environments, etc, under which such data are obtained. The importance of associating test data with the specifications governing their acquisition cannot be overemphasized.2. Where laboratory test data is used to predict the reliability of equipment in the field, it will be necessary to use appropriate multiplying factors on the laboratory-determined failurerates.3. The presentation of field data is described in AS 2529.

Reconfirmed 1994