ASTM B 748 : 1990 : R2016
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
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Standard Test Method for Measurement of Thickness of Metallic Coatings by Measurement of Cross Section with a Scanning Electron Microscope
Hardcopy , PDF
11-11-2021
English
18-11-2016
Important note : Users cannot be edited or removed once added to your Multi user PDF.CONTAINED IN VOL. 02.05, 2017 Defines the measurement of metallic coating thicknesses by examination of a cross section with a scanning electron microscope (SEM).
| Committee |
B 08
|
| DevelopmentNote |
Supersedes EIA 364-48 (08/2006)
|
| DocumentType |
Test Method
|
| Pages |
4
|
| ProductNote |
Reconfirmed 2016
|
| PublisherName |
American Society for Testing and Materials
|
| Status |
Superseded
|
| SupersededBy | |
| Supersedes |
1.1This test method covers the measurement of metallic coating thicknesses by examination of a cross section with a scanning electron microsope (SEM).
1.2The values stated in SI units are to be regarded as standard. No other units of measurement are included in this standard.
1.3This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.
| ASTM B 984 : 2012 : R2020 : EDT 1 | Standard Specification for Electrodeposited Coatings of Palladium-Cobalt Alloy for Engineering Use |
| ASTM B 633 : 2019 | Standard Specification for Electrodeposited Coatings of Zinc on Iron and Steel |
| ASTM B 488 : 2018 | Standard Specification for Electrodeposited Coatings of Gold for Engineering Uses |
| ASTM B 530 : 2009 : R2021 | Standard Test Method for Measurement of Coating Thicknesses by the Magnetic Method: Electrodeposited Nickel Coatings on Magnetic and Nonmagnetic Substrates |
| ASTM E 766 : 1998 | Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope |
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