ASTM C 657 : 1993 : R1998

CONTAINED IN VOL. 15.02, 2017 Specifies the determination of the dc volume resistivity of a smooth, preferably polished, glass by measuring the resistance to passage of a small amount of direct current through the glass at a voltage high enough to assure adequate sensitivity.

1.1 This test method covers the determination of the dc volume resistivity of a smooth, preferably polished, glass by measuring the resistance to passage of a small amount of direct current through the glass at a voltage high enough to assure adequate sensitivity. This current must be measured under steady-state conditions that is neither a charging current nor a space-charge, build-up polarization current.

1.2 This test method is intended for the determination of sensitivities less than 10 [omega][dot]cm in the temperature range from 25°C to the annealing point of the glass.

1.3 This standard does not purport to address all of the safety problems, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use. For specific hazard statements, see Section 5.