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ASTM D 2791 : 1993 : R2001

Superseded

Superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

View Superseded by

Standard Test Methods for Continuous Determination of Sodium in Water

Available format(s)

Hardcopy , PDF

Superseded date

11-11-2014

Superseded by

ASTM D 2791 : 2007

Language(s)

English

Published date

01-01-2001

€67.30
Excluding VAT

Committee
D 19
DocumentType
Test Method
Pages
10
PublisherName
American Society for Testing and Materials
Status
Superseded
SupersededBy

1.1 These test methods cover the continuous determination of trace amounts of sodium in water using an ion-selective electrode and flame photometry. Two test methods are included:

Sections
Test Method A-Ion-Selective Electrode8 to 16
Test Method B-Flame Photometry17 to 26

1.2 Test Method A is based on continuous application of the sodium ion electrode as reported in the technical literature (1-3). It is generally applicable over the range of 0.05 to 10 000 µg/L.

1.3 Test Method B is based on the use of flame photometry. It is most applicable to measurements below 20 µg/L. Compared with Test Method A, it is less vulnerable to interference from other monovalent cations at low concentrations and can reach equilibrium with very low sample throughput.

1.4 The analyst should be aware that adequate collaborative data for precision and bias statements as required by Practice D2777 are not provided. See Sections 16 and 26 for details.

1.5 The values stated in SI units are to be regarded as standard. The inch-pound units given in parentheses are for information only.

1.6 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use. For specific hazard statements see Section 6.

ASTM D 5127 : 2013 : R2018 Standard Guide for Ultra-Pure Water Used in the Electronics and Semiconductor Industries

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