ASTM E 1078 : 2014
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
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Standard Guide for Specimen Preparation and Mounting in Surface Analysis
Hardcopy , PDF
04-12-2020
English
05-11-2014
Important note : Users cannot be edited or removed once added to your Multi user PDF.| Committee |
E 42
|
| DocumentType |
Guide
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| Pages |
10
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| PublisherName |
American Society for Testing and Materials
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| Status |
Superseded
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| SupersededBy | |
| Supersedes |
1.1This guide covers specimen preparation and mounting prior to, during, and following surface analysis and applies to the following surface analysis disciplines:
1.1.1Auger electron spectroscopy (AES),
1.1.2X-ray photoelectron spectroscopy (XPS and ESCA), and
1.1.3Secondary ion mass spectrometry (SIMS).
1.1.4Although primarily written for AES, XPS, and SIMS, these methods will also apply to many surface sensitive analysis methods, such as ion scattering spectrometry, low energy electron diffraction, and electron energy loss spectroscopy, where specimen handling can influence surface sensitive measurements.
1.2The values stated in SI units are to be regarded as standard. No other units of measurement are included in this standard.
1.3This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.
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| ASTM E 1523 : 2003 | Standard Guide to Charge Control and Charge Referencing Techniques in X-Ray Photoelectron Spectroscopy |
| ASTM E 1127 : 2008 | Standard Guide for Depth Profiling in Auger Electron Spectroscopy |
| ASTM E 1523 : 2015 | Standard Guide to Charge Control and Charge Referencing Techniques in X-Ray Photoelectron Spectroscopy (Withdrawn 2024) |
| ASTM E 1829 : 2002 | Standard Guide for Handling Specimens Prior to Surface Analysis |
| ASTM E 1829 : 2009 | Standard Guide for Handling Specimens Prior to Surface Analysis |
| ASTM E 1523 : 1997 | Standard Guide to Charge Control and Charge Referencing Techniques in X-Ray Photoelectron Spectroscopy |
| ASTM E 1127 : 2008 : R2015 | Standard Guide for Depth Profiling in Auger Electron Spectroscopy (Withdrawn 2024) |
| ASTM E 1127 : 2003 | Standard Guide for Depth Profiling in Auger Electron Spectroscopy |
| ASTM E 1829 : 1997 | Standard Guide for Handling Specimens Prior to Surface Analysis |
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