ASTM E 1078 : 2014 : R2020
Current
The latest, up-to-date edition.
Standard Guide for Specimen Preparation and Mounting in Surface Analysis
Hardcopy , PDF
English
04-12-2020
Important note : Users cannot be edited or removed once added to your Multi user PDF.| Committee |
E 42
|
| DocumentType |
Guide
|
| Pages |
10
|
| PublisherName |
American Society for Testing and Materials
|
| Status |
Current
|
| Supersedes |
1.1This guide covers specimen preparation and mounting prior to, during, and following surface analysis and applies to the following surface analysis disciplines:
1.1.1Auger electron spectroscopy (AES),
1.1.2X-ray photoelectron spectroscopy (XPS and ESCA), and
1.1.3Secondary ion mass spectrometry (SIMS).
1.1.4Although primarily written for AES, XPS, and SIMS, these methods will also apply to many surface sensitive analysis methods, such as ion scattering spectrometry, low energy electron diffraction, and electron energy loss spectroscopy, where specimen handling can influence surface sensitive measurements.
1.2The values stated in SI units are to be regarded as standard. No other units of measurement are included in this standard.
1.3This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety, health, and environmental practices and determine the applicability of regulatory limitations prior to use.
1.4This international standard was developed in accordance with internationally recognized principles on standardization established in the Decision on Principles for the Development of International Standards, Guides and Recommendations issued by the World Trade Organization Technical Barriers to Trade (TBT) Committee.
| ASTM E 1523 : 2024 | Standard Guide to Charge Control and Charge Referencing Techniques in X-Ray Photoelectron Spectroscopy |
| ASTM E 1523 : 2015 | Standard Guide to Charge Control and Charge Referencing Techniques in X-Ray Photoelectron Spectroscopy (Withdrawn 2024) |
| ASTM E 1127 : 2008 : R2015 | Standard Guide for Depth Profiling in Auger Electron Spectroscopy (Withdrawn 2024) |
| ASTM E 1127 : 2024 | Standard Guide for Depth Profiling in Auger Electron Spectroscopy |
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