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ASTM E 1127 : 2024

Current

Current

The latest, up-to-date edition.

Standard Guide for Depth Profiling in Auger Electron Spectroscopy

Available format(s)

Hardcopy , PDF

Language(s)

English

Published date

01-10-2024

€56.53
Excluding VAT

Committee
E 42
DocumentType
Guide
Pages
6
PublisherName
American Society for Testing and Materials
Status
Current
Supersedes

1.1This guide covers procedures used for depth profiling in Auger electron spectroscopy.

1.2Guidelines are given for depth profiling by the following:

Section

Ion Sputtering 

6

Angle Lapping and Cross-Sectioning 

7

Mechanical Cratering 

8

Mesh Replica Method

9

Nondestructive Depth Profiling 

10

1.3The values stated in SI units are to be regarded as standard. No other units of measurement are included in this standard.

1.4This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety, health, and environmental practices and determine the applicability of regulatory limitations prior to use.

1.5This international standard was developed in accordance with internationally recognized principles on standardization established in the Decision on Principles for the Development of International Standards, Guides and Recommendations issued by the World Trade Organization Technical Barriers to Trade (TBT) Committee.

ASTM E 996 : 2019 Standard Practice for Reporting Data in Auger Electron Spectroscopy and X-ray Photoelectron Spectroscopy
ASTM E 1078 : 2014 : R2020 Standard Guide for Specimen Preparation and Mounting in Surface Analysis
ASTM E 2735 : 2014 : R2020 Standard Guide for Selection of Calibrations Needed for X-ray Photoelectron Spectroscopy (XPS) Experiments

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