1.1This test method covers a procedure for experimentally determining the x-ray elastic constants (XEC) for the evaluation of residual and applied stresses by x-ray diffraction techniques. The XEC relate macroscopic stress to the strain measured in a particular crystallographic direction in polycrystalline samples. The XEC are a function of the elastic modulus, Poisson’s ratio of the material and the hkl plane selected for the measurement. There are two XEC that are referred to as 1/2S2hkl and S1 hkl.
1.2This test method is applicable to all x-ray diffraction instruments intended for measurements of macroscopic residual stress that use measurements of the positions of the diffraction peaks in the high back-reflection region to determine changes in lattice spacing.
1.3This test method is applicable to all x-ray diffraction techniques for residual stress measurement, including single, double, and multiple exposure techniques.
1.4The values stated in SI units are to be regarded as standard. The values given in parentheses after SI units are provided for information only and are not considered standard.
1.5This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety, health, and environmental practices and determine the applicability of regulatory limitations prior to use.
1.6This international standard was developed in accordance with internationally recognized principles on standardization established in the Decision on Principles for the Development of International Standards, Guides and Recommendations issued by the World Trade Organization Technical Barriers to Trade (TBT) Committee.