ASTM E 1577 : 2011 : REDLINE
Current
The latest, up-to-date edition.
Standard Guide for Reporting of Ion Beam Parameters Used in Surface Analysis
English
01-05-2011
Important note : Users cannot be edited or removed once added to your Multi user PDF.CONTAINED IN VOL. 03.06, 2014 Describes the information needed to characterize ion beams used in surface analysis.
| Committee |
E 42
|
| DevelopmentNote |
Supersedes ASTM E 684. (01/2013)
|
| DocumentType |
Redline
|
| Pages |
3
|
| PublisherName |
American Society for Testing and Materials
|
| Status |
Current
|
| Supersedes |
1.1 This guide covers the information needed to characterize ion beams used in surface analysis.
1.2 This guide does not cover all information required to perform a sputter depth profile (see referenced documents), specify any properties of the specimen except its surface normal, and discuss the rationale for choosing a particular set of ion beam parameters (1,7). This guide does assume that the ion flux has a unique direction, that is, is an ion beam, rather than a wide spectrum of velocity vectors more typical of a plasma.
1.3 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.
| ASTM E 1127 : 2008 : R2015 | Standard Guide for Depth Profiling in Auger Electron Spectroscopy (Withdrawn 2024) |
| ASTM E 2735 : 2014 : REDLINE | Standard Guide for Selection of Calibrations Needed for X-ray Photoelectron Spectroscopy (XPS) Experiments |
| ASTM E 1127 : 2008 | Standard Guide for Depth Profiling in Auger Electron Spectroscopy |
| ASTM E 684 : 2004 | Standard Practice for Approximate Determination of Current Density of Large-Diameter Ion Beams for Sputter Depth Profiling of Solid Surfaces (Withdrawn 2012) |
| ASTM E 673 : 2003 | Standard Terminology Relating to Surface Analysis (Withdrawn 2012) |
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