ASTM E 1622 : 1994 : R1999 : EDT 1

CONTAINED IN VOL. 03.05, 2005 Defines procedures for the correction of line overlap interferences encountered in the analysis of metallic and non-metallic specimens in wavelength dispersive X-ray spectrometry.

1.1 Procedures are given for the correction of line overlap interferences encountered in the analysis of metallic and nonmetallic specimens in wavelength dispersive X-ray spectrometry.

1.2 Spectral interference occurs when a line of another element appears at or close to the same wavelength as the analyte line. The interfering line or lines may be from the same spectral order as the analyte line or may be from another spectral order. Line overlap interferences from higher order lines are usually removed when pulse-height discrimination is used.

1.3 The procedures given in this practice are applicable to making corrections for interferences arising from concomitants in the sample. Interfering lines from the X-ray tube and associated instrumental components are usually specific to the system and the procedure for dealing with these may be found elsewhere. This is treated by E. P. Bertin.

1.4 This practice is not generally applicable to simultaneous X-ray spectrometers if it is not possible to measure a line of the interfering element. Correction is possible, however, if the concentration of the interfering element is known and can be entered into the analytical program.

1.5 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.