ASTM E 1855 : 1996
Superseded
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
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Standard Test Method for Use of 2N2222A Silicon Bipolar Transistors as Neutron Spectrum Sensors and Displacement Damage Monitors
Available format(s)
PDF
Language(s)
English
Published date
10-12-1996
Superseded date
11-11-2014
Superseded by
€71.88
Excluding VAT
| Committee |
E 10
|
| DocumentType |
Test Method
|
| Pages |
11
|
| PublisherName |
American Society for Testing and Materials
|
| Status |
Superseded
|
| SupersededBy |
1.1 This test method covers how 2N2222A silicon bipolar transistors can be used either as dosimetry sensors in the determination of neutron energy spectra, or as silicon 1-MeV equivalent displacement damage fluence monitors.
| ASTM E 721 : 2016 | Standard Guide for Determining Neutron Energy Spectra from Neutron Sensors for Radiation-Hardness Testing of Electronics |
| ASTM F 1190 : 2018 | Standard Guide for Neutron Irradiation of Unbiased Electronic Components |
| ASTM E 1854 : 2013 | Standard Practice for Ensuring Test Consistency in Neutron-Induced Displacement Damage of Electronic Parts |
| ASTM F 980 : 2016 | Standard Guide for Measurement of Rapid Annealing of Neutron-Induced Displacement Damage in Silicon Semiconductor Devices |
Summarise
€71.88
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