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ASTM E 1855 : 2015 : REDLINE

Superseded

Superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

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Standard Test Method for Use of 2N2222A Silicon Bipolar Transistors as Neutron Spectrum Sensors and Displacement Damage Monitors

Available format(s)

PDF

Superseded date

12-05-2020

Language(s)

English

Published date

01-10-2015

€67.30
Excluding VAT

CONTAINED IN VOL. 12.02, 2015 Describes the use of 2N2222A silicon bipolar transistors as either dosimetry sensors to determine neutron energy spectra, or as silicon 1-MeV equivalent displacement damage fluence monitors.

Committee
E 10
DocumentType
Redline
Pages
13
PublisherName
American Society for Testing and Materials
Status
Superseded
SupersededBy

1.1This test method covers the use of 2N2222A silicon bipolar transistors as dosimetry sensors in the determination of neutron energy spectra and as 1 Mev(Si) equivalent displacement damage fluence monitors.

1.2The neutron displacement in silicon can serve as a neutron spectrum sensor in the range 0.1 to 2.0 MeV when fission foils are not available. It has been applied in the fluence range between 2 × 1012 n/cm 2 to 1 × 1014 n/cm2 and should be useful up to 1 × 1015 n/cm2. This test method details the acquisition and use of 1 Mev(Si) equivalent fluence information for the partial determination of the neutron spectra by using 2N2222A transistors.

1.3This sensor yields a direct measurement of the silicon 1 Mev equivalent fluence by the transfer technique.

1.4The values stated in SI units are to be regarded as standard. No other units of measurement are included in this standard.

1.5This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory requirements prior to use.

ASTM F 980 : 2016 : REDLINE Standard Guide for Measurement of Rapid Annealing of Neutron-Induced Displacement Damage in Silicon Semiconductor Devices
ASTM E 721 : 2016 : REDLINE Standard Guide for Determining Neutron Energy Spectra from Neutron Sensors for Radiation-Hardness Testing of Electronics
ASTM E 1854 : 2013 : REDLINE Standard Practice for Ensuring Test Consistency in Neutron-Induced Displacement Damage of Electronic Parts
ASTM F 1190 : 2018 : REDLINE Standard Guide for Neutron Irradiation of Unbiased Electronic Components

ASTM E 720 : 2016 : REDLINE Standard Guide for Selection and Use of Neutron Sensors for Determining Neutron Spectra Employed in Radiation-Hardness Testing of Electronics
ASTM E 2450 : 2016 : REDLINE Standard Practice for Application of CaF<inf>2</inf>(Mn) Thermoluminescence Dosimeters in Mixed Neutron-Photon Environments
ASTM E 265 : 2015 : REDLINE Standard Test Method for Measuring Reaction Rates and Fast-Neutron Fluences by Radioactivation of Sulfur-32
ASTM E 721 : 2016 : REDLINE Standard Guide for Determining Neutron Energy Spectra from Neutron Sensors for Radiation-Hardness Testing of Electronics
ASTM E 1854 : 2013 : REDLINE Standard Practice for Ensuring Test Consistency in Neutron-Induced Displacement Damage of Electronic Parts
ASTM E 722 : 2014 : REDLINE Standard Practice for Characterizing Neutron Fluence Spectra in Terms of an Equivalent Monoenergetic Neutron Fluence for Radiation-Hardness Testing of Electronics
ASTM E 170 : 2017 : REDLINE Standard Terminology Relating to Radiation Measurements and Dosimetry
ASTM E 261 : 2016 : REDLINE Standard Practice for Determining Neutron Fluence, Fluence Rate, and Spectra by Radioactivation Techniques
ASTM E 944 : 2013-01 GUIDE FOR APPLICATION OF NEUTRON SPECTRUM ADJUSTMENT METHODS IN REACTOR SURVEILLANCE

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