ASTM E 1894 : 2018
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
View Superseded by
Standard Guide for Selecting Dosimetry Systems for Application in Pulsed X-Ray Sources
Hardcopy , PDF
08-05-2024
English
12-12-2018
Important note : Users cannot be edited or removed once added to your Multi user PDF.This guide provides assistance in selecting and using dosimetry systems in flash X-ray experiments. Both dose and dose-rate techniques are described.
| Committee |
E 10
|
| DocumentType |
Guide
|
| Pages |
19
|
| PublisherName |
American Society for Testing and Materials
|
| Status |
Superseded
|
| SupersededBy | |
| Supersedes |
1.1This guide provides assistance in selecting and using dosimetry systems in flash X-ray experiments. Both dose and dose-rate techniques are described.
1.2Operating characteristics of flash X-ray sources are given, with emphasis on the spectrum of the photon output.
1.3Assistance is provided to relate the measured dose to the response of a device under test (DUT). The device is assumed to be a semiconductor electronic part or system.
1.4This international standard was developed in accordance with internationally recognized principles on standardization established in the Decision on Principles for the Development of International Standards, Guides and Recommendations issued by the World Trade Organization Technical Barriers to Trade (TBT) Committee.
| ASTM F 526 : 2016 | Standard Test Method for Using Calorimeters for Total Dose Measurements in Pulsed Linear Accelerator or Flash X-ray Machines |
| ASTM F 744M : 2016 | Standard Test Method for Measuring Dose Rate Threshold for Upset of Digital Integrated Circuits (Metric) (Withdrawn 2023) |
| ASTM F 773M : 2016 | Standard Practice for Measuring Dose Rate Response of Linear Integrated Circuits (Metric) (Withdrawn 2023) |
| ASTM F 980 : 2016 | Standard Guide for Measurement of Rapid Annealing of Neutron-Induced Displacement Damage in Silicon Semiconductor Devices |
| ASTM F 996 : 2011 : R2018 | Standard Test Method for Separating an Ionizing Radiation-Induced MOSFET Threshold Voltage Shift Into Components Due to Oxide Trapped Holes and Interface States Using the Subthreshold Current–Voltage Characteristics (Withdrawn 2023) |
| ASTM F 526 : 2021 | Standard Test Method for Using Calorimeters for Total Dose Measurements in Pulsed Linear Accelerator or Flash X-ray Machines |
| ASTM F 980 : 2016 : R2024 | Standard Guide for Measurement of Rapid Annealing of Neutron-Induced Displacement Damage in Silicon Semiconductor Devices |
| ASTM F 1467 : 2018 | Standard Guide for Use of an X-Ray Tester (≈10 keV Photons) in Ionizing Radiation Effects Testing of Semiconductor Devices and Microcircuits |
| ASTM E 1249 : 2010 | Standard Practice for Minimizing Dosimetry Errors in Radiation Hardness Testing of Silicon Electronic Devices Using Co-60 Sources |
| ASTM E 1249 : 2015 : R2021 | Standard Practice for Minimizing Dosimetry Errors in Radiation Hardness Testing of Silicon Electronic Devices Using Co-60 Sources |
| ASTM E 1249 : 2000 : R2005 | Standard Practice for Minimizing Dosimetry Errors in Radiation Hardness Testing of Silicon Electronic Devices Using Co-60 Sources |
| ASTM E 170 : 2020 | Standard Terminology Relating to Radiation Measurements and Dosimetry |
| ASTM E 1249 : 2015 | Standard Practice for Minimizing Dosimetry Errors in Radiation Hardness Testing of Silicon Electronic Devices Using Co-60 Sources |
| ASTM E 666 : 2021 | Standard Practice for Calculating Absorbed Dose From Gamma or X Radiation |
| ASTM E 170 : 2023 | Standard Terminology Relating to Radiation Measurements and Dosimetry |
| ASTM E 1249 : 2000 | Standard Practice for Minimizing Dosimetry Errors in Radiation Hardness Testing of Silicon Electronic Devices Using Co-60 Sources |
| ASTM E 666 : 2014 | Standard Practice for Calculating Absorbed Dose From Gamma or X Radiation |
Access your standards online with a subscription
Features
-
Simple online access to standards, technical information and regulations.
-
Critical updates of standards and customisable alerts and notifications.
-
Multi-user online standards collection: secure, flexible and cost effective.