ASTM E 2039 : 1999

1.1 This practice is to be used for gathering and reporting dynamic dielectric data. It incorporates laboratory practice for determining dynamic dielectric properties of specimens subjected to an oscillatory electric field using a variety of dielectric sensor/cell configurations on a variety of instruments called dielectric, microdielectric, DETA (DiElectric Thermal Analysis), or DEA (DiElectric Analysis) analyzers.

1.2 This practice determines permittivity, loss factor, ionic conductivity (or resistivity), dipole relaxation times, and transition temperatures, and is intended for materials that have a relative permittivity in the range of 1 to 10⁵; loss factors in the range of 0 to 10⁸; and, conductivities in the range of 10¹⁶ to 10¹⁰ siemens/cm.

1.3 The practice is primarily useful when conducted over a range of temperatures for nonreactive systems (-160°C to degradation) and over time (and temperature) for reactive systems and is valid for frequencies ranging from 1 mHz to 100 kHz.

1.4 Apparent discrepancies may arise in results obtained under differing experimental conditions. Without changing the observed data, completely reporting the conditions (as described in this practice) under which the data were obtained, in full, will enable apparent differences observed in another study to be reconciled.

1.5 Values reported in SI units are to be regarded as the standard.

1.6 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use. Specific precautionary statements are given in Section 10.